Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-09-25
2007-09-25
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10860852
ABSTRACT:
A method of correction for design data includes the steps of sequentially applying a plurality of corrections to a plurality of features based on a plurality of feature tolerances to design data in a predetermined order, and providing corrected design data.
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Invarium, Inc.
Lin Sun James
Smith-Hill John
Smith-Hill and Bedell
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