Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-08-28
2007-08-28
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11005866
ABSTRACT:
Correcting a mask pattern includes accessing the mask pattern segmented into segments. An attribute value is established for each segment, where the attribute value for a segment describes an attribute of the segment. The following is repeated for one or more of the attribute values to generate a corrected mask pattern: selecting segments using one or more attribute values; calculating a current correction value for each of the selected segments with respect to previously selected segments updated according to previously calculated correction values; and updating the selected segments according to the current correction values.
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Brady III W. James
Chiang Jack
Garner Jacqueline J.
Tat Binh
Telecky , Jr. Frederick J.
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