Copper diffusion barrier

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S638000, C438S639000, C257SE21159

Reexamination Certificate

active

07816266

ABSTRACT:
The invention concerns a method of forming a copper portion surrounded by an insulating material in an integrated circuit structure, the insulating material being a first oxide, the method having steps including forming a composite material over a region of the insulating material where the copper portion is to be formed, the composite material having first and second materials, annealing such that the second material reacts with the insulating material to form a second oxide that provides a diffusion barrier to copper; and depositing a copper layer over the composite material by electrochemical deposition to form the copper portion.

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patent: 2009/0102051 (2009-04-01), Beyer et al.
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patent: 2009/0209099 (2009-08-01), Yu et al.
European Search Report from corresponding European Application No. 06301019, filed Oct. 5, 2006.

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