Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2011-03-22
2011-03-22
Chu, John S (Department: 1722)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S326000, C430S905000, C430S910000, C526S313000, C526S320000
Reexamination Certificate
active
07910282
ABSTRACT:
In order to improve a resist pattern shape in a semiconductor lithography process, which is a factor largely affecting on a processing precision, an integration degree and yield, a copolymer for semiconductor lithography where a composition of a hydroxyl group-containing repeating unit in a low molecular weight region is controlled, and a method of producing the same are provided.According to the invention, in a copolymer for semiconductor lithography, which is obtained by copolymerizing a monomer having a hydroxyl group and a monomer having no hydroxyl group, when a copolymer of which composition of a hydroxyl group-containing repeating unit is controlled is used, the object can be achieved.
REFERENCES:
patent: 5625020 (1997-04-01), Breyta et al.
patent: 6156477 (2000-12-01), Motomi et al.
patent: 6277546 (2001-08-01), Breyta et al.
patent: 6365321 (2002-04-01), Chen et al.
patent: 6653044 (2003-11-01), Takeda et al.
patent: 10 251315 (1998-09-01), None
patent: 10 274852 (1998-10-01), None
patent: 2001-109153 (2001-04-01), None
patent: 2001 151823 (2001-06-01), None
patent: 2002-194029 (2002-07-01), None
patent: 2002-201210 (2002-07-01), None
patent: 2002-229220 (2002-08-01), None
patent: 2003-213721 (2003-07-01), None
patent: 2003-306514 (2003-10-01), None
patent: 2004 300441 (2004-10-01), None
patent: 2005-275072 (2005-10-01), None
patent: 2005-309376 (2005-11-01), None
patent: 99 40132 (1999-08-01), None
patent: 99 50322 (1999-10-01), None
Miki Kiyomi
Okada Takayoshi
Yamagishi Takanori
Yamaguchi Satoshi
Chu John S
Maruzen Petrochemical Co. Ltd.
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
LandOfFree
Copolymer for semiconductor lithography and producing method... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Copolymer for semiconductor lithography and producing method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Copolymer for semiconductor lithography and producing method... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2680289