Controlled cleavage thin film separation process using a reusabl

Semiconductor device manufacturing: process – Semiconductor substrate dicing

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438459, 438428, H01L 2100, H01L 21265

Patent

active

061598259

ABSTRACT:
A technique for forming films of material (12) from a donor substrate (10). The technique has a step of introducing energetic particles (22) through a surface of a donor substrate (10) to a selected depth (20) underneath the surface, where the particles have a relatively high concentration to define donor substrate material (12) above the selected depth. Energy is provided to a selected region of the substrate to cleave a thin film of material from the donor substrate. Particles are introduced again into the donor substrate underneath a fresh surface of the donor substrate. A second thin film of material is then cleaved from the donor substrate.

REFERENCES:
patent: 2614055 (1952-10-01), Senarelens
patent: 3117022 (1964-01-01), Bronson et al.
patent: 3225820 (1965-12-01), Riordan
patent: 3551213 (1970-12-01), Boyle
patent: 3786359 (1974-01-01), King
patent: 3806380 (1974-04-01), Kitada et al.
patent: 3832219 (1974-08-01), Nelson et al.
patent: 3900636 (1975-08-01), Curry et al.
patent: 3915757 (1975-10-01), Engel
patent: 3957107 (1976-05-01), Altoz et al.
patent: 3993909 (1976-11-01), Drews et al.
patent: 4006340 (1977-02-01), Gorinas
patent: 4039416 (1977-08-01), White
patent: 4074139 (1978-02-01), Pankove
patent: 4107350 (1978-08-01), Berg et al.
patent: 4108751 (1978-08-01), King
patent: 4116751 (1978-09-01), Zaromb
patent: 4121334 (1978-10-01), Wallis
patent: 4170662 (1979-10-01), Weiss et al.
patent: 4252837 (1981-02-01), Auton
patent: 4274004 (1981-06-01), Kanai
patent: 4342631 (1982-08-01), White et al.
patent: 4346123 (1982-08-01), Kaufmann
patent: 4361600 (1982-11-01), Brown
patent: 4368083 (1983-01-01), Bruel et al.
patent: 4412868 (1983-11-01), Brown et al.
patent: 4452644 (1984-06-01), Bruel et al.
patent: 4468309 (1984-08-01), White
patent: 4471003 (1984-09-01), Cann
patent: 4486247 (1984-12-01), Ecer et al.
patent: 4490190 (1984-12-01), Speri
patent: 4500563 (1985-02-01), Ellenberger et al.
patent: 4508056 (1985-04-01), Bruel et al.
patent: 4536657 (1985-08-01), Bruel
patent: 4566403 (1986-01-01), Fournier
patent: 4567505 (1986-01-01), Pease
patent: 4568563 (1986-02-01), Jackson et al.
patent: 4585945 (1986-04-01), Bruel et al.
patent: 4684535 (1987-08-01), Heinecke et al.
patent: 4704302 (1987-11-01), Bruel et al.
patent: 4717683 (1988-01-01), Parrillo et al.
patent: 4764394 (1988-08-01), Conrad
patent: 4837172 (1989-06-01), Mizuno et al.
patent: 4846928 (1989-07-01), Dolins et al.
patent: 4847792 (1989-07-01), Barna et al.
patent: 4853250 (1989-08-01), Boulos et al.
patent: 4883561 (1989-11-01), Gmitter et al.
patent: 4887005 (1989-12-01), Rough et al.
patent: 4894709 (1990-01-01), Phillips et al.
patent: 4931405 (1990-06-01), Kamijo et al.
patent: 4948458 (1990-08-01), Ogle
patent: 4952273 (1990-08-01), Popov
patent: 4960073 (1990-10-01), Suzuki et al.
patent: 4982090 (1991-01-01), Wittmaack
patent: 4996077 (1991-02-01), Moslehi et al.
patent: 5015353 (1991-05-01), Hubler et al.
patent: 5034343 (1991-07-01), Rouse et al.
patent: 5070040 (1991-12-01), Pankove
patent: 5082793 (1992-01-01), Li
patent: 5110748 (1992-05-01), Sarma
patent: 5133826 (1992-07-01), Dandl
patent: 5196355 (1993-03-01), Wittkower
patent: 5198371 (1993-03-01), Li
patent: 5202095 (1993-04-01), Houchin et al.
patent: 5203960 (1993-04-01), Dandl
patent: 5234529 (1993-08-01), Johnson
patent: 5234535 (1993-08-01), Beyer et al.
patent: 5242861 (1993-09-01), Inaba
patent: 5250328 (1993-10-01), Otto
patent: 5252178 (1993-10-01), Moslehi
patent: 5269880 (1993-12-01), Jolly et al.
patent: 5273610 (1993-12-01), Thomas, III et al.
patent: 5304509 (1994-04-01), Sopori
patent: 5342472 (1994-08-01), Imahashi et al.
patent: 5354381 (1994-10-01), Sheng
patent: 5363603 (1994-11-01), Miller et al.
patent: 5368710 (1994-11-01), Chen et al.
patent: 5370765 (1994-12-01), Dandl
patent: 5374564 (1994-12-01), Bruel
patent: 5376560 (1994-12-01), Aronowitz et al.
patent: 5404079 (1995-04-01), Ohkuni et al.
patent: 5405480 (1995-04-01), Benzing et al.
patent: 5411592 (1995-05-01), Ovshinsky et al.
patent: 5435880 (1995-07-01), Minato et al.
patent: 5476691 (1995-12-01), Komvopoulos et al.
patent: 5487785 (1996-01-01), Horiike et al.
patent: 5494835 (1996-02-01), Bruel
patent: 5504328 (1996-04-01), Bonser
patent: 5558718 (1996-09-01), Leung
patent: 5559043 (1996-09-01), Bruel
patent: 5653811 (1997-08-01), Chan
patent: 5705421 (1998-01-01), Matsushita et al.
patent: 5710057 (1998-01-01), Kenney
patent: 5714395 (1998-02-01), Bruel
patent: 5869387 (1999-02-01), Sato et al.
patent: 5877070 (1999-03-01), Goesele et al.
patent: 5920764 (1999-07-01), Hanson et al.
patent: 5966620 (1999-10-01), Sakaguchi et al.
B.H.Lee et al., "A Novel Pattern Transfer Process for Bonded SOI Giga-bit DRAMs," 1996 IEEE Int'l. SOI Conference Proceedings, IEEE Electron Devices Society, pp. 1996.
Chu, Paul K.et al., "Recent Applications of Plasma Immersion Ion Implantation--," Semiconductor International, pp. 165-172, 1996.
Alles, Michael et al., "Thin Film Silicon on Insulator: An Enabling Technology," Semiconductor International, pp. 67-72, 1997.
Chu, Paul K., "Synthesis of SOI Materials Using Plasma Immersion Ion Implantation," Mat. Res. Soc. Symp. Proc. vol. 438 .COPYRGT. 1997 Materials Research Society, pp. 333-343, 1997.
Picraux, S. Thomas et al., "Ion Implantation of Surfaces," Scientific American, vol. 252, No. 3, pp. 102-113, 1985.
U.S. Dept. of Energy, "The Fusion Connection: . . . ", Plasma Coating, pp. 6-7, 1985.
Cassidy, Victor M., "Ion Implantation Process Toughens Metalworking Tools," Modern Metals, pp. 65-67, 1984.
Sioshansi, Piran, "Ion Beam Modification of Materials for Industry," Thin Solid Film, vol. 118, pp. 61-71, 1984.
Hulett, D.M. et al., "Ion Nitriding and Ion Implantation: A Comparison," Metal Progress, pp. 18-21, 1985.
Renier, M. et al., "A New Low-Energy Ion Implanter for Bombardment of Cylindrical Surfaces," Vacuum, vol. 35, No. 12, pp. 577-578, 1985.
Basta, Nicholas, "Ion-Beam Implantation," High Technology, 1985.
Patent Abstracts of Japan, vol. 7, No. 107 (E-174), May 11, 1993, JP-58-030145 A, Feb. 22, 1983.
Matsuda et al., "Large Diameter Ion Beam Implantation System," Nuclear Instruments and Methods, vol. B21, pp. 314-316, 1987.
Stanley Wolf Ph.D., Silicon Processing for the VLSI Era (vol. 2), pp. 66-79.
Cheung, N.W., "Plasma Immersion Ion Implantation for Semiconductor Processing," Material Chemistry and Physics, vol. 46/2-3, pp. 132-139 (1996).
X. Lu et al., "SOI Material Technology Using Plasma Immersion Ion Implantation," Proceedings 1996 IEEE International SOI Conference (Oct. 1996).
Veldkamp, W.B. et al., "Binary Optics," Scientific American, pp. 50-55, May 1992.
I.B.M. Technical Disclosure Bulletinm, vol. 29, No. 3, p. 1416, Aug. 1986.
Li, J., "Novel Semiconductor Substrate Formed by Hydrogen Ion Implantation into Silicon", Appl. Phys. Lett., vol. 55, No. 21, pp. 2223-2224, Nov. 20, 1989.
Burggraff, Peter, "Advanced Plasma Source: What's Working?" Semiconductor International, pp. 56-59, May 1994.
Chu, P. K. et al., Plasma Immersion Ion Implantation-A Fledgling Technique for Semiconductor Processing, Materials Science and Engineering Reports: A Review Journal, pp. 207-280, vol. R17, Nos. 6-7, Nov. 30, 1996.
Moreau, Wayne M., "Semiconductor Lithography, Principles, Practices, and Materials," Plenum Press, 1988.
Wolff, S., Silicon Processing for the VLSI Era (vol. 2), Lattice Press, 1990.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Controlled cleavage thin film separation process using a reusabl does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Controlled cleavage thin film separation process using a reusabl, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Controlled cleavage thin film separation process using a reusabl will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-216297

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.