Control apparatus

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S027000, C714S031000, C714S727000

Reexamination Certificate

active

07870429

ABSTRACT:
For a control apparatus to be boundary scan testable even when running, including processor cores in an operator to be capable of self-repairing a troubling part, an operator (2) has processor cores (2a,2b) connected to a boundary scan bus (12), and adapted to mutually diagnose opponent processor cores for troubles, by boundary scan testing each other in a time-dividing manner.

REFERENCES:
patent: 6115763 (2000-09-01), Douskey et al.
patent: 7062637 (2006-06-01), Ganapathy et al.
patent: 7080283 (2006-07-01), Songer et al.
patent: 7139947 (2006-11-01), Miner et al.
patent: 7475309 (2009-01-01), Picano et al.
patent: 7536597 (2009-05-01), McGowan
patent: 7627794 (2009-12-01), Kinter
patent: 7636870 (2009-12-01), Ueno
patent: 7665002 (2010-02-01), White et al.
patent: 7685487 (2010-03-01), Kuo et al.
patent: 0 382 972 (1990-08-01), None
patent: 9-5400 (1997-01-01), None
patent: 2000-206202 (2000-07-01), None
patent: 2001-306343 (2001-11-01), None
U.S. Appl. No. 12/108,774, filed Apr. 24, 2008, Sameda, et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Control apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Control apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Control apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2621393

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.