Static information storage and retrieval – Systems using particular element
Reexamination Certificate
2007-07-26
2010-06-22
Pert, Evan (Department: 2826)
Static information storage and retrieval
Systems using particular element
C365S133000, C365S174000, C257S009000, C257S903000, C257SE49001
Reexamination Certificate
active
07742323
ABSTRACT:
A structure for a memory device including a plurality of substantially planar thin-film layers or a plurality of conformal thin-film layers is disclosed. The thin-film layers form a memory element that is electrically in series with first and second cladded conductors and operative to store data as a plurality of conductivity profiles. A select voltage applied across the first and second cladded conductors is operative to perform data operations on the memory device. The memory device may optionally include a non-ohmic device electrically in series with the memory element and the first and second cladded conductors. Fabrication of the memory device does not require the plurality of thin-film layers be etched in order to form the memory element. The memory element can include a CMO layer having a selectively crystallized polycrystalline portion and an amorphous portion. The cladded conductors can include a core material made from copper.
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Bornstein Jonathan
Cheung Robin
Hansen David
Oh Travis Byonghyop
Rinerson Darrell
Pert Evan
Unity Semiconductor Corporation
Wilson Scott R
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