Content based yield prediction of VLSI designs

Details Content based yield prediction of VLSI designs Content based yield prediction of VLSI designs

2008-04-11

2010-02-09

Garbowski, Leigh Marie (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07661081

ABSTRACT:
An integrated circuit system and program product for predicting yield of a VLSI design. An integrated circuit system is provided including a system for identifying and grouping sub-circuits contained within an integrated circuit design by circuit type; a critical area calculation system for determining critical area values for different regions, wherein each different region is associated with a circuit type; a tallying system for calculating a plurality of tallies of critical area values based on circuit type; and a plurality of modeling subsystems for separately modeling each of the plurality of tallies based on circuit type.

REFERENCES:
patent: 3751647 (1973-08-01), Maeder et al.
patent: 5773315 (1998-06-01), Jarvis
patent: 6317859 (2001-11-01), Papadopoulou
patent: 7013441 (2006-03-01), Bickford et al.
patent: 2006/0265185 (2006-11-01), Lanzerotti et al.
J. Khare et al., “Accurate Estimation of Defect-Related Yield Loss in Reconfigurable VLSI Circuits,” IEEE Journal of Solid State Circuits, vol. 28, No. 2, Feb. 1993, pp. 146-156.
C.H. Stapper, “Modeling of Integrated Circuit Defect Sensitivities,” IBM J. Res. Develop., vol. 27, No. 6, Nov. 1983, pp. 549-557.
C.H. Stapper et. al., “Yield Model for ASIC and Processor Chips,” 1993 IEEE Int'l Workshop on Defect and Fault Tolerance in VLSI Systems, pp. 136-143.

Affiliated with

Also associated with

Rating

Content based yield prediction of VLSI designs does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Content based yield prediction of VLSI designs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Content based yield prediction of VLSI designs will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4155174