Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2005-11-29
2005-11-29
Chaudhuri, Olik (Department: 2823)
Semiconductor device manufacturing: process
With measuring or testing
C438S758000
Reexamination Certificate
active
06969621
ABSTRACT:
Embodiments of the invention include an apparatus for uniformly contaminating samples. The apparatus includes a housing that contains a rotatable carousel for the holding samples. A drive element is used for rotating the carousel. The apparatus includes a contaminant dispenser for dispersing a contaminant onto the samples. The apparatus also includes a control element that can be used to control contaminant dose and carousel rotation rate and rotation time. A method for uniformly contaminating samples includes providing such a contamination chamber and placing a plurality of samples within the chamber. A contaminant is introduced into the chamber and the samples are spun so that the contaminant is uniformly distributed onto the spinning samples. After contamination the samples are removed from the chamber.
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Beyer Weaver & Thomas LLP
Chaudhuri Olik
LSI Logic Corporation
Malsawma Lex H.
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