Contactless testing of electronic materials and devices using mi

Details Contactless testing of electronic materials and devices using mi Contactless testing of electronic materials and devices using mi

1992-05-01

1995-05-23

Cuchlinski, Jr., William A.

Thermal measuring and testing

Leak or flaw detection

With heating or cooling of specimen for test

219711, 374 7, 374124, 374137, 356237, 2503381, G01N 2572

Patent

active

054174945

ABSTRACT:
A method and system for probing a volume of material by detecting local conductivity in the material using microwave radiation. The probed volume of material is exposed to microwave radiation of a wavelength selected to excite the carriers of electrical current and induce localized heating in regions of the volume of material which is an electronic material or a device. A thermographic imaging system detects size and distribution of the locally heated regions, and a processing system determines a selected property of the material by analyzing the size and distribution of the locally heated regions. The thermographic imaging system can be an infra-red imaging system which detects infra-red radiation emitted from the locally heated region, or it can be a system which deposits a thermally sensitive film onto a surface of the material and detects thermally induced changes in the deposited film caused by the transferred heat. The testing system can be also used in conjunction with a light source to probe distribution of photoexcited carriers, or with an electronic testing system to examine local conductivity and performance of devices in an active or passive state.

REFERENCES:
patent: 4430897 (1984-02-01), Quate
patent: 4468136 (1984-08-01), Murphy et al.
patent: 4486103 (1984-12-01), Ando
patent: 4521118 (1985-06-01), Rosencwaig
patent: 4543486 (1985-09-01), Rose
patent: 4640626 (1987-02-01), Schmid et al.
patent: 4644162 (1987-02-01), Bantel et al.
patent: 4854724 (1989-08-01), Adams et al.
patent: 4965451 (1990-10-01), Solter
patent: 5032727 (1991-07-01), Cox, Jr. et al.
patent: 5047713 (1991-09-01), Kirino et al.
patent: 5052816 (1991-10-01), Nakamura et al.
Guy, Arthur W., "Analyses of Electromagnetic Fields Induced in Biological Tissues by Thermographic Studies on Equivalent Phantom Models", IEEE Trans. On Microwave Theory, vol. MTT-19, No. 2, Feb. 1971, pp. 205-214.
Lin, Lawrence H. et al., "High-Speed Inspection of LCD Panels", Insystems, San Jose, Calif., USA. (No Date).
Hall, Henry P. et al., "Testing TFT-LCD Substrates with a Transfer Admittance Method", SID 91 Digest, 1991, pp. 682-685.
Tse, P. K. et al., "Leakage Current and Current Distribution Investigation in High Voltage (320V) Integrated Circuits Using Fluorescent Microthermography", AT&T Bell Laboratories, (No Date).
Sega, Ronald M. et al., "Infrared Application to the Detection of Induced Surface Currents ", SPIE, vol. 304 Modern Utilization of Technology VII, 1981, pp. 84-91.

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