Contactless apparatus and method for thickness determination of

Details Contactless apparatus and method for thickness determination of Contactless apparatus and method for thickness determination of

1986-07-07

1988-09-13

Howell, Janice A.

Radiant energy

Inspection of solids or liquids by charged particles

Including a radioactive source

2503581, G01N 23203

Patent

active

047711736

ABSTRACT:
An apparatus and method for measuring the thickness of thin basal coatings on work pieces. The apparatus comprises a beta backscatter type measuring instrument including a work piece positioning system to permit the precise positioning of a coated work piece surface to radiation in a repeatable, non-destructive, non-contacting position with respect to the radiation source.

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