Contact structure and contact liner process

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S621000, C257S759000, C257S760000, C257S774000

Reexamination Certificate

active

10925527

ABSTRACT:
A contact structure and a method of forming thereof for semiconductor devices or assemblies are described. The method provides process steps to create a contact structure encompassed by a sacrificial contact medium having an opening therein that is lined with a conductive spacer liner that effectively prevents the contact structure from being damaged during removal of the surrounding sacrificial contact medium material. The sacrificial contact medium is then replaced with a non-boron doped dielectric material.

REFERENCES:
patent: 6404058 (2002-06-01), Taguwa
patent: 6436762 (2002-08-01), Tzeng et al.
patent: 6518626 (2003-02-01), Moore
patent: 6555461 (2003-04-01), Woo et al.
patent: 6596583 (2003-07-01), Agarwal et al.
patent: 6680514 (2004-01-01), Geffken et al.
patent: 2003/0008417 (2003-01-01), Suzuki
patent: 2003/0137054 (2003-07-01), Ishihara
patent: 2003/0141597 (2003-07-01), Houston et al.
patent: 2004/0178504 (2004-09-01), Griffin et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Contact structure and contact liner process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contact structure and contact liner process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contact structure and contact liner process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3797779

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.