Contact structure, a semiconductor device employing the...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material

Reexamination Certificate

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C257SE21209

Reexamination Certificate

active

08039829

ABSTRACT:
A contact structure that includes a first pattern formed on a substrate, wherein the first pattern has a recessed region in an upper surface thereof, a planarized buffer pattern formed on the first pattern, and a conductive pattern formed on the planarized buffer pattern.

REFERENCES:
patent: 6511862 (2003-01-01), Hudgens et al.
patent: 7105396 (2006-09-01), Hwang et al.
patent: 7394088 (2008-07-01), Lung
patent: 2006/0237756 (2006-10-01), Park et al.
patent: 2007/0249090 (2007-10-01), Philipp et al.
patent: 2009/0035514 (2009-02-01), Kang et al.
patent: 1020000038672 (2000-07-01), None
patent: 1020010016930 (2001-03-01), None
patent: 1020010083588 (2001-09-01), None
patent: 1020030052628 (2003-06-01), None
patent: 1020040038421 (2004-05-01), None
patent: 1020060091190 (2006-08-01), None
patent: 1020060110559 (2006-10-01), None
Korean Office Action issued Aug. 28, 2009 in corresponding Korean Patent Appln No. 10-2008-0029249.

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