Contact probe, method of manufacturing the contact probe,...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C029S825000

Reexamination Certificate

active

07151385

ABSTRACT:
A method of manufacturing a contact probe includes an electroforming step of, using a resist film (522) arranged on a substrate (521) as a pattern frame having a shape corresponding to a contact probe, performing electroforming to fill a gap in the resist film (522) to form a metal layer (526), a tip end shaping step of obliquely removing and sharpening that part of the metal layer (526) which serves as a tip end portion of the contact probe, and a take-out step of taking out only the metal layer (526) from the pattern frame.

REFERENCES:
patent: 3904461 (1975-09-01), Estep et al.
patent: 4878294 (1989-11-01), Dugan et al.
patent: 5021364 (1991-06-01), Akamine et al.
patent: 5027062 (1991-06-01), Dugan et al.
patent: 5513430 (1996-05-01), Yanof et al.
patent: 5989994 (1999-11-01), Khoury et al.
patent: 6469394 (2002-10-01), Wong et al.
patent: 6553662 (2003-04-01), Sedberry
patent: 19957326 (2000-05-01), None
patent: 57178174 (1982-11-01), None
patent: 06300778 (1994-10-01), None
patent: 07273157 (1995-10-01), None
patent: 11337575 (1999-12-01), None
patent: 2000046870 (2000-02-01), None
patent: 2000162241 (2000-06-01), None
patent: 2000164407 (2000-06-01), None
patent: 2000228262 (2000-08-01), None
patent: 2000292436 (2000-10-01), None
patent: 2001004798 (2001-01-01), None
patent: 2001013163 (2001-01-01), None
patent: 2001052827 (2001-02-01), None
patent: 2001116765 (2001-04-01), None
patent: 2001332323 (2001-11-01), None
patent: WO 00/33089 (2000-06-01), None
J. P. Rasmussen et al., “Fabrication of an All-Metal Atomic Force Microscope Probe”, Proceedings of International Solid State Sensors and Actuators Conference (Transducers '97), Jun. 16-19, 1997, Chicago, IL, USA, vol. 1, pp. 463-466.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Contact probe, method of manufacturing the contact probe,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contact probe, method of manufacturing the contact probe,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contact probe, method of manufacturing the contact probe,... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3716760

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.