Contact probe and probe device

Details Contact probe and probe device Contact probe and probe device

2005-08-30

2005-08-30

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S762010

Reexamination Certificate

active

06937042

ABSTRACT:
A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.

REFERENCES:
patent: 4686463 (1987-08-01), Logan
patent: 4972143 (1990-11-01), Kamensky et al.
patent: 5382898 (1995-01-01), Subramanian
patent: 5416429 (1995-05-01), McQuade et al.
patent: 5521518 (1996-05-01), Higgins
patent: 5673477 (1997-10-01), Hattori et al.
patent: 2001/0019276 (2001-09-01), Yoshida et al.
patent: 2004/0160236 (2004-08-01), Yoshida et al.

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