Contact portion of semiconductor device, and thin film...

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Reexamination Certificate

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C438S030000

Reexamination Certificate

active

07061015

ABSTRACT:
A gate wire is formed on a substrate. Next, after forming a gate insulating film, a semiconductor layer and an ohmic contact layer subsequently are formed thereon. Next, a data wire is formed. Next, a passivation layer and an organic insulating film are deposited, and patterned to form contact holes for exposing the drain electrode, the gate pad and the data pad, respectively. Here, the organic insulating film around the contact holes is formed thinner than that in the other portions. Next, the organic insulating film around the contact holes is removed by an ashing process to expose the borderline of the passivation layer in the contact holes, thereby removing an under-cut. Then, a pixel electrode, an assistant gate pad and an assistant data pad respectively connected to the drain electrode, the gate pad and the data pad are formed.

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patent: 6088071 (2000-07-01), Yamamoto et al.
patent: 6228747 (2001-05-01), Joyner
patent: 6300152 (2001-10-01), Kim
patent: 6333258 (2001-12-01), Miyata et al.
patent: 6338989 (2002-01-01), Ahn et al.
patent: 2001/0032981 (2001-10-01), Kong et al.
patent: 11-153808 (1999-06-01), None
patent: 2000183040 (2000-06-01), None
patent: 1020010016713 (2001-03-01), None

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