Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making named article
Patent
1987-03-27
1989-03-07
Dees, Jose G.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making named article
430 22, 430323, 430327, 430329, 430330, G03C 500
Patent
active
048106216
ABSTRACT:
An apparatus and method for the generation of patterns on large optics. A coating layer is deposited on the surface of a large substrate, whereupon a photoresist layer is deposited on the coating layer in relatively small localized areas. A flexible mask is fabricated embodying the pattern to be generated. This flexible mask is then aligned with any desired point on the substrate and brought into contact with the photoresist layer. The photoresist layer is then exposed and each localized area is developed and the underlying coating layer is etched. After the excess photoresist material is washed away the pattern, etched into the coating layer, remains.
REFERENCES:
patent: 3658526 (1972-04-01), Haugh
patent: 3973964 (1976-08-01), Lange
patent: 4388388 (1983-06-01), Kornbau et al.
Akkapeddi Prasad R.
Hufnagel Robert E.
Dees Jos,e G.
Fattibene Paul A.
Grimes Edwin T.
Murphy Thomas P.
The Perkin-Elmer Corporation
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