Contact formation

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S612000, C257SE21627

Reexamination Certificate

active

08034706

ABSTRACT:
The present disclosure includes various method of contact embodiments. One such method embodiment includes creating a trench in an insulator stack material of a particular thickness and having a portion of the trench positioned between two of a number of gates. This method includes depositing a filler material in the trench and etching the filler material to a particular depth that is less than the particular thickness of the insulator stack material. This method also includes depositing a spacer material to at least one side surface of the trench to the particular depth of the filler material and depositing a conductive material into the trench over the filler material.

REFERENCES:
patent: 6066556 (2000-05-01), Jeong
patent: 6174767 (2001-01-01), Chi
patent: 6504210 (2003-01-01), Divakaruni et al.
patent: 6861313 (2005-03-01), Song
patent: 7074717 (2006-07-01), Rhodes
patent: 7217647 (2007-05-01), Yang
patent: 7737022 (2010-06-01), Mathew et al.
patent: 2001/0049185 (2001-12-01), Hosotani et al.
patent: 2002/0003266 (2002-01-01), Manning
patent: 2003/0082900 (2003-05-01), Peng et al.
patent: 2004/0036125 (2004-02-01), Oh et al.
patent: 2004/0041204 (2004-03-01), Ireland
patent: 2004/0121536 (2004-06-01), Hung et al.
patent: 2004/0152294 (2004-08-01), Choi
patent: 2004/0161923 (2004-08-01), Bae et al.
patent: 2004/0173912 (2004-09-01), Rhodes
patent: 2005/0009270 (2005-01-01), Parekh et al.
patent: 2006/0148168 (2006-07-01), Li et al.
patent: 2006/0151821 (2006-07-01), Melik-Martirosian et al.
patent: 2006/0240654 (2006-10-01), Wei et al.
patent: 2006/0263979 (2006-11-01), Nejad et al.
patent: 2007/0048951 (2007-03-01), Boubekeur et al.
International Search Report and Written Opinion for related PCT Application No. PCT/US2007/004573, Mailed Aug. 28, 2007 (15 pgs.).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Contact formation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contact formation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contact formation will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4276109

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.