Constructing a waveform from multiple threshold samples

Details Constructing a waveform from multiple threshold samples Constructing a waveform from multiple threshold samples

2005-09-27

2005-09-27

Gregory, Bernarr E. (Department: 3662)

Optics: measuring and testing

Range or remote distance finding

With photodetection

C356S401000, C342S195000

Reexamination Certificate

active

06950177

ABSTRACT:
Technology is disclosed for measuring distances. A measurement device emits a beam that reflects on the surface of an object. The measurement device determines the distance to the object, based on the time of flight of the beam from transmission to capture by the measurement device. The measurement device derives feedback reference pulses from pulses in the emitted beam and injects them into the device's receive path—creating a receive waveform that includes one or more feedback reference pulses and corresponding pulses in the return beam. The device uses the pulses in the waveform to measure time of flight. The measurement device can attenuate the feedback reference pulses to intensities similar or equal to the intensities of the return pulses. The measurement device can include a histogram processor that collects waveform samples at varying comparison thresholds. The device employs the most accurate information at each threshold to create a digitized composite waveform that corresponds to the analog waveform received by the measurement device. In some instances the measurement device can process the digitized waveform—removing noise, scaling reference pulses, and removing distortions caused by pulse trailing edges running into subsequent pulses.

REFERENCES:
patent: 4745562 (1988-05-01), Prazdny
patent: 4985844 (1991-01-01), Foley et al.
patent: 5298905 (1994-03-01), Dahl
patent: 5612779 (1997-03-01), Dunne
patent: 6137566 (2000-10-01), Leonard et al.
patent: 6331887 (2001-12-01), Shiraishi et al.
patent: 6418386 (2002-07-01), Wong-Lam et al.
patent: 6590521 (2003-07-01), Saka et al.
Jian-Hua, A Weak Structural Texture Analysis Technique to Wave Heights for Ocean Waves Image, Jan. 1988, vol. 4, Issue 88, pp. 105-110.

Affiliated with

Also associated with

Rating

Constructing a waveform from multiple threshold samples does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Constructing a waveform from multiple threshold samples, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Constructing a waveform from multiple threshold samples will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3449983