Connector for direct connection testing of electronics devices

Details Connector for direct connection testing of electronics devices Connector for direct connection testing of electronics devices

2000-12-18

2003-05-13

Le, N. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S755090, C439S063000

Reexamination Certificate

active

06563325

ABSTRACT:

FIELD OF THE INVENTION
The invention relates to a system and a method for testing wireless devices, such as wireless communication devices. More particularly, the invention relates to a system and a method for directly testing wireless devices by inserting a test connector into a test port of a wireless device.
DESCRIPTION OF THE RELATED ART
Wireless communication devices are becoming increasingly prevalent, with cellular telephones being a particularly notable example. With these devices, radio-frequency (RF) signals are transmitted and received to create a communication link between the device and another wireless device. During the manufacture of such devices, it is necessary to test functionally the RF signal generation and reception circuitry as well as the signal processing circuitry prior to shipment of the device to a customer.
In general, two testing schemes are available: transmission testing and direct connection testing. In transmission testing, signals are transferred between a test set-up antenna and an antenna on the device under test. Accurate transmission testing is difficult to achieve in a mass production environment due to the mutual interference generated by testing many devices within close proximity to one another. In direct connection testing, the device under test is equipped with an accessible test port which allows for the direct physical coupling of the device under test to a testing device. Using direct connection testing, the device under test can be electrically and mechanically connected to test equipment using a test connector. Consequently, direct connection testing avoids the wireless transmission of signals and so overcomes the difficulties of transmission testing due to the mutual interference caused by the transmission of RF signals by the test system and the multiple devices under test.
Direct connection testing has been achieved using a prior art test connector
100
such as that shown in FIG.
1
. The prior art test connector
100
is intended to be permanently installed in the test equipment and to mate temporarily with the device under test during the testing process. Radiall, S. A. (101 Rue Philibert Hoffman, 93116 Rosny Sous Bois, France) manufactures the prior art test connector
100
(part number R191-977-500).
Referring to
FIG. 1
, the prior art test connector
100
has a cylindrical base
120
which is fixedly attached to the testing equipment. Mounted to the cylindrical base
120
is a body
130
. The body
130
can have multiple planar faces in order to allow a tool, such as an adjustable or customized wrench, to secure the body
130
and rotate the prior art test connector
100
, thereby allowing a user to install or to remove the prior art test connector
200
from testing equipment (not shown). Furthermore, a connector saver
140
has multiple planar faces in order to allow a tool, such as an adjustable or customized wrench, to secure the body
130
and rotate the prior art test connector
100
, thereby allowing a user to install or to remove the prior art test connector
100
. Furthermore, the connector saver
140
can act to protect the action of a tool from damaging the prior art test connector
100
when the prior art test connector
100
is inserted or removed from the testing equipment.
Attached to the body
130
is a cylindrical shaft
150
with a cylindrical tip
160
with dimensions corresponding to a test port on a device to be tested. During the testing process, the cylindrical tip
160
of the cylindrical shaft
150
is inserted into the test port of the device under test. RF test signals are transmitted to the device under test via a transmitter passing through the center of the prior art test connector
100
. Once the prior art test connector
100
is inserted into the test port of the device under test, the transmitter mates with the test port to create an electrical connection and allow RF test signals to be transmitted to the device under test.
The prior art test connector
100
requires an accurate fit between the leading edge
180
of the cylindrical tip
160
and the inner wall of the test port (not shown) of the device under test in order to establish a ground path. The leading edge
180
of the cylindrical tip
160
of the prior art test connector
100
forms a ninety degree angle with a plane tangential to the outer surface of the cylindrical shaft
150
. The nexus between the leading edge
180
of the cylindrical tip
160
and the outer surface of the cylindrical shaft
150
forms a shoulder
185
which is abrupt and only slightly rounded. The abrupt shoulder
185
closely matches the dimensions of the test port and therefore requires an extremely accurate insertion of the cylindrical tip
160
into the test port. Due to the sharp angles formed at the shoulder
185
of the cylindrical tip, even the slightest misalignment during insertion of the prior art test connector
100
into the test port of the device under test will prevent the cylindrical tip
160
from entering the test port. As a result, this configuration provides little or no tolerance for positional inaccuracy during insertion of the prior art test connector
100
into the test port of the device under test.
In a laboratory setting where the test equipment operator can manually insert the prior art test connector
100
into the device under the test, the prior art test connector
100
operates adequately. Manual insertion allows the operator to ensure that the prior art test connector
100
fits accurately into the test port of the device under test by allowing the operator to adjust the attachment angle and insertion pressure to ensure a proper connection.
In the mass production environment, however, the prior art test connector
100
proves to be unsatisfactory. Typically, in the mass production setting, the device under test is mounted on a moveable mechanism. The moveable mechanism moves the device under test into position whereby the prior art test connector
100
is automatically inserted into the test port of the device under test. The prior art test connector
100
is fixedly attached to the test equipment which is designed to adjust along both the both the X and Y axes. Consequently, automatic insertion of the prior art test connector
100
into the test port of the device under test is adjustable in only two directions. The mass production environment does not allow for careful re-alignment of individual devices under test. As a result, misalignment can result when the prior art test connector
100
is inserted into the test port during this automatic process. As discussed above, even slight misalignment can prevent proper insertion of the prior art test connector
100
into the test port of the device under test. As a result of improper or inadequate insertion of the prior art test connector
100
into the test port, the conductive material of the outer shell of the cylindrical tip
160
cannot electrically mate properly with the test port. Consequently, misalignment can fail to provide an adequate grounding path between the prior art test connector
100
and the test port ground of the device under test. Additionally, misalignment can lead to misleading variations in the test results due to an improper electrical mating and thereby can cause false test failures. Furthermore, due to the sharp angles of the shoulder
185
and the test port, improper alignment may also cause damage to the prior art test connector
100
, the test equipment, or the device under test.
Thus, it will be appreciated that there is a need in the technology for a means and a method for providing a direct connection test system using a test connector which overcomes the described deficiencies in the prior art. The improvement should allow for proper automatic insertion of the test connector into the test port of the device under test. Additionally, the improvement should allow for a direct connection test system which provides accurate results and reduces damage to the device under test.
SUMMARY
One embodiment of the invention describes a connector for

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