Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-01-18
2011-01-18
Lin, Sun J (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07873931
ABSTRACT:
A computer-implemented method of incorporating probe points within a circuit design for implementation within an integrated circuit device can include routing probe nets of the circuit design in an overlap mode, identifying a plurality of probe net routes including a common overlapping portion, and including a switch at each location within the circuit design where at least two probe net routes of the plurality of probe net routes diverge from a common point. The circuit design can be output.
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Cuenot Kevin T.
George Thomas
Lin Sun J
Xilinx , Inc.
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