Configurable IC with trace buffer and/or logic analyzer...

Electronic digital logic circuitry – Reliability

Reexamination Certificate

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C326S014000, C326S016000, C326S038000

Reexamination Certificate

active

07550991

ABSTRACT:
Some embodiments of the invention provide a configurable integrated circuit (IC) that includes several configurable circuits for configurably performing different operations and several user design state (UDS) circuits for storing user-design state values. The IC further includes a trace buffer for storing user-design state values associated with an operational trigger even of the IC. In some embodiments, the configurable circuits, UDS circuits, and tracer buffer are on a single IC die.

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