Conditioner device for conditioning polishing pad and...

Abrading – Machine – Combined

Reexamination Certificate

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Details

C451S443000, C451S056000

Reexamination Certificate

active

07578727

ABSTRACT:
The present invention relates to a conditioner device for polishing pad and a chemical mechanical polishing (CMP) apparatus having the same. The conditioner device of the present invention comprises a rotable support plate including a support plate surface comprising a center area located about the rotational axis of the support plate, a mid area surrounding the center area, and a peripheral area surrounding the mid area, a plurality of conditioning zones located within a portion of the mid area of the support plate surface. A plurality of hard particles which are densely arranged within the conditioning zones and are attached to the support plate surface. A plurality of passages defined by the conditioning zones within which a slurry flows, the passages occupying a portion of the mid area which is not occupied by the conditioning zones, the center area and the peripheral area.

REFERENCES:
patent: 6213856 (2001-04-01), Cho et al.
patent: 6884155 (2005-04-01), Sung et al.
patent: 6949012 (2005-09-01), Barnett, III
patent: 7066795 (2006-06-01), Balagani et al.
patent: 2004/0072510 (2004-04-01), Kinoshita et al.
patent: 2004/0110453 (2004-06-01), Barnett et al.
patent: 2001-121418 (2002-05-01), None
patent: 2003-071718 (2003-03-01), None
patent: 2003/0063408 (2003-07-01), None
patent: 2004-0070492 (2004-08-01), None
English language abstract for Korean Publication No. 2003-0063408.
English language abstract for Japanese Publication No. 2001-121418.
English language abstract for Japanese Publication No. 2003-071718.

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