Semiconductor device manufacturing: process – Making passive device – Trench capacitor
Reexamination Certificate
2005-07-19
2005-07-19
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Making passive device
Trench capacitor
C438S243000
Reexamination Certificate
active
06919254
ABSTRACT:
A two-transistor SRAM cell includes a first FET. The first FET is an ultrathin FET of a first polarity type and includes a control electrode, a first load electrode and a second electrode. The first load electrode is coupled to a first control line. The SRAM cell also includes a second FET. The second FET is an ultrathin FET of a second polarity type and includes a gate, a source and a drain. The second FET source is coupled to the first FET gate. The second FET gate is coupled to the first FET drain and the second FET source is coupled to a first potential. The SRAM cell further includes a first load device that is coupled between a second potential and the first FET gate. The SRAM cell additionally includes a second load device coupled between the second FET gate and a second control line.
REFERENCES:
patent: 5388068 (1995-02-01), Ghoshal et al.
patent: 5754010 (1998-05-01), Caravella et al.
patent: 5754468 (1998-05-01), Hobson
patent: 5774392 (1998-06-01), Kraus et al.
patent: 5825687 (1998-10-01), Yin
patent: 6011726 (2000-01-01), Batson et al.
patent: 6057555 (2000-05-01), Reedy et al.
patent: 6090648 (2000-07-01), Reedy et al.
patent: 6104045 (2000-08-01), Forbes et al.
patent: 6128216 (2000-10-01), Noble, Jr. et al.
patent: 6184588 (2001-02-01), Kim et al.
patent: 6194759 (2001-02-01), Sano et al.
patent: 6208555 (2001-03-01), Noble
patent: 6212102 (2001-04-01), Georgakos et al.
patent: 6225165 (2001-05-01), Noble, Jr. et al.
patent: 6265266 (2001-07-01), Dejenfelt et al.
patent: 6275433 (2001-08-01), Forbes
patent: 6287913 (2001-09-01), Agnello et al.
patent: 6342718 (2002-01-01), Noble
patent: 6448601 (2002-09-01), Forbes et al.
patent: 6449186 (2002-09-01), Noble
patent: 6459113 (2002-10-01), Morihara et al.
patent: 6519197 (2003-02-01), Forbes
patent: 6605961 (2003-08-01), Forbes
patent: 2001/0015907 (2001-08-01), Noble
patent: 2002/0028550 (2002-03-01), Moribara et al.
patent: 2003/0048656 (2003-03-01), Forbes
patent: 2003/0076721 (2003-04-01), Forbes
patent: 2003/0214840 (2003-11-01), Forbes
patent: 2004/0026697 (2004-02-01), Forbes
patent: 10 335488 (1998-12-01), None
patent: 02001308298 (2001-11-01), None
Lage et al,Advanced SRAM technology—the rate between 4T and 6T cells, Abstract(Web address-http://pluto.et.org). Technical Digest—Proceedings of the 1996 IEEE International Electron Devices Meeting Dec. 8-11, 1996.
Noda et al1.9-μm Loadless CMOS Four-Transistor SRAM Cell in a 0 18-μm Logic Technology, date unknown, ULSI Device Development Laboratories NEC Corporation, Japan, 5 pages.
Micro)n Technology, Inc.
Nhu David
Wells St. John P.S.
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