Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-24
2006-10-24
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07127694
ABSTRACT:
A reticle set includes a first reticle including a first wiring pattern having a first termination pattern; a second reticle including a plurality of via patterns; and a third reticle including a second wiring pattern having a second termination pattern and a second line pattern connected to an end of the second termination pattern.
REFERENCES:
patent: 6436804 (2002-08-01), Igarashi et al.
patent: 7051308 (2006-05-01), McManus et al.
patent: 2003/0005390 (2003-01-01), Hashimoto et al.
patent: 2003/0005399 (2003-01-01), Igarashi et al.
Igarashi Mutsunori
Watanabe Atsushi
Dinh Paul
DLA Piper (US) LLP
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