Computer control of the electron microscope sample stage

Details Computer control of the electron microscope sample stage Computer control of the electron microscope sample stage

1990-10-12

1993-01-12

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

Electron microscope type

250307, H01J 3726

Patent

active

051792800

ABSTRACT:
A method and apparatus for controlling the tilting of the sample stage of an electron microscope along X and Y axes are disclosed. A plurality of different orientations are displayed stereoscopically on a monitor with a spot representing the current orientation being highlighted. The control signals which cause the sample to tilt are generated by moving a cursor on the stereoscopic projection.

REFERENCES:
patent: 3727051 (1973-04-01), Page

Affiliated with

Also associated with

Rating

Computer control of the electron microscope sample stage does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Computer control of the electron microscope sample stage, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Computer control of the electron microscope sample stage will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1221889