Computer automated method for optimizing an integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000, C716S030000, C716S030000, C716S030000, C430S005000, C430S030000

Reexamination Certificate

active

07451429

ABSTRACT:
A computer automated method for designing an integrated circuit includes placing a plurality of marks on each of contours of a plurality of patterns allocated in a chip area; dividing the marks into a plurality of groups so that the adjacent marks are merged in a same group; determining one of the groups as a candidate hot spot based on a total number of marks included in each of the groups; and modifying the corresponding pattern in the candidate hot spot.

REFERENCES:
patent: 6631307 (2003-10-01), Tzu et al.
patent: 6668367 (2003-12-01), Cobb et al.
patent: 7194704 (2007-03-01), Kotani et al.
patent: 2003-162041 (2003-06-01), None
U.S. Appl. No. 10/304,895, A. Ikeuchi.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Computer automated method for optimizing an integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Computer automated method for optimizing an integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Computer automated method for optimizing an integrated... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4038893

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.