Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Plural fluid growth steps with intervening diverse operation
Reexamination Certificate
2011-01-25
2011-01-25
Smith, Zandra (Department: 2822)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Plural fluid growth steps with intervening diverse operation
C257SE21091, C257SE21093, C257S104000
Reexamination Certificate
active
07875535
ABSTRACT:
A compound semiconductor device includes: a conductive SiC substrate; an AlN buffer layer formed on said conductive SiC substrate and containing Cl; a compound semiconductor buffer layer formed on said AlN layer which contains Cl, said compound semiconductor buffer layer not containing Cl; and a device constituent layer or layers formed above said compound semiconductor buffer layer not containing Cl.
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Partial Translation of International Search Report Written Opinion on the International Searching Authority of PCT/JP2006/314743.
International Search Report of PCT/JP2006/314743, date of mailing Oct. 31, 2006.
Imanishi Kenji
Kikkawa Toshihide
Fujitsu Limited
Patton Paul E
Smith Zandra
Westerman Hattori Daniels & Adrian LLP
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