Compound semiconductor device and method for controlling...

Details Compound semiconductor device and method for controlling... Compound semiconductor device and method for controlling...

2005-06-21

2005-06-21

Thompson, Craig A. (Department: 2813)

Semiconductor device manufacturing: process

With measuring or testing

Electrical characteristic sensed

C438S385000

Reexamination Certificate

active

06908777

ABSTRACT:
A method of controlling characteristics of a compound semiconductor device, whereby the compound semiconductor device is formed so as to include a plurality of resistors having the same ratio of a difference between a surface area of a corresponding resistivity region and the combined overlapping surface area of a corresponding pair of electrodes to the combined overlapping surface area of the corresponding pair of electrodes. In this manner, a resistivity of a resistor is precisely controlled.

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