Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate
2006-04-19
2009-10-27
Del Cotto, Gregory R (Department: 1796)
Semiconductor device manufacturing: process
Chemical etching
C438S478000, C510S175000, C510S176000, C510S499000, C510S502000, C510S505000, C510S506000
Reexamination Certificate
active
07608540
ABSTRACT:
A composition for removing a photoresist includes about 5 to about 20 percent by weight of an alcoholamide compound, about 15 to about 60 percent by weight of a polar aprotic solvent, about 0.1 to about 6 percent by weight of an additive, and pure water. The alcoholamide compound is chemically structured as follows:where R1is a hydroxyl group or a hydroxyalkyl group, and R2is a hydrogen atom or a hydroxyalkyl group.
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patent: 2004/0266637 (2004-12-01), Rovito et al.
patent: 2003-0686699 (2003-03-01), None
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Chae Seung-Ki
Choi Tae-Hyo
Han Myoung-Ok
Jun Pil-Kwon
Kim Se-Yeon
Del Cotto Gregory R
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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