Composition and method for damascene CMP

Etching a substrate: processes – Mechanically shaping – deforming – or abrading of substrate – Nongaseous phase etching

Reexamination Certificate

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C451S037000, C051S307000

Reexamination Certificate

active

07837888

ABSTRACT:
The invention provides a method of chemically-mechanically polishing a substrate having at least one feature defined thereon, wherein the feature has at least one dimension with a size W, with a chemical-mechanical polishing composition. The polishing composition comprises particles of an abrasive wherein the particles have a mean particle diameter DMwherein the mean particle diameter of the particles satisfies the equation: DM>W. The invention further provides a method of preparing the chemical-mechanical polishing composition.

REFERENCES:
patent: 5196353 (1993-03-01), Sandhu et al.
patent: 5433651 (1995-07-01), Lustig et al.
patent: 5609511 (1997-03-01), Moriyama et al.
patent: 5643046 (1997-07-01), Katakabe et al.
patent: 5658183 (1997-08-01), Sandhu et al.
patent: 5730642 (1998-03-01), Sandhu et al.
patent: 5838447 (1998-11-01), Hiyama et al.
patent: 5872633 (1999-02-01), Holzapfel et al.
patent: 5893796 (1999-04-01), Birang et al.
patent: 5949927 (1999-09-01), Tang
patent: 5964643 (1999-10-01), Birang et al.
patent: 6227949 (2001-05-01), Yi et al.
patent: 6291349 (2001-09-01), Molnar
patent: 6293848 (2001-09-01), Fang et al.
patent: 6334880 (2002-01-01), Negrych et al.
patent: 6346202 (2002-02-01), Molnar
patent: 6350678 (2002-02-01), Pramanick et al.
patent: 6354916 (2002-03-01), Uzoh et al.
patent: 6358853 (2002-03-01), Cadien et al.
patent: 6365520 (2002-04-01), Rhoades et al.
patent: 6375694 (2002-04-01), Roberts et al.
patent: 6402884 (2002-06-01), Robinson et al.
patent: 6409781 (2002-06-01), Wojtczak et al.
patent: 6596042 (2003-07-01), Feng et al.
patent: 6599174 (2003-07-01), Spikes, Jr.
patent: 6612917 (2003-09-01), Bruxvoort
patent: 6620215 (2003-09-01), Li et al.
patent: 6638328 (2003-10-01), Lee et al.
patent: 6676492 (2004-01-01), Li
patent: 6723144 (2004-04-01), Katagiri et al.
patent: 6753250 (2004-06-01), Hill et al.
patent: 6939211 (2005-09-01), Taylor et al.
patent: 6976904 (2005-12-01), Li et al.
patent: 7060621 (2006-06-01), Minamihaba et al.
patent: 7419911 (2008-09-01), Chelle et al.
patent: 7569613 (2009-08-01), Chane-Ching
patent: 2002/0004317 (2002-01-01), Cadien et al.
patent: 2002/0017063 (2002-02-01), Beitel et al.
patent: 2002/0061715 (2002-05-01), Uzoh et al.
patent: 2002/0173252 (2002-11-01), Li
patent: 2003/0047710 (2003-03-01), Babu et al.
patent: 2003/0077995 (2003-04-01), Li et al.
patent: 2003/0211815 (2003-11-01), Carter et al.
patent: 2004/0126966 (2004-07-01), Cheong et al.
patent: 2004/0203241 (2004-10-01), Hampden-Smith et al.
patent: 2004/0226918 (2004-11-01), Lee et al.
patent: 2004/0259366 (2004-12-01), Kim et al.
patent: 2004/0261323 (2004-12-01), Minamihaba et al.
patent: 2005/0178742 (2005-08-01), Chelle et al.
patent: 2005/0275617 (2005-12-01), Murooka
patent: 2006/0032150 (2006-02-01), So et al.
patent: 2006/0037251 (2006-02-01), Kurata et al.
patent: 2006/0169597 (2006-08-01), Liu et al.
patent: 2006/0175295 (2006-08-01), Chu et al.
patent: 2006/0246723 (2006-11-01), Park et al.
patent: 2006/0261306 (2006-11-01), Li et al.
patent: 2006/0270235 (2006-11-01), Siddiqui et al.
patent: 2006/0283093 (2006-12-01), Petrovic et al.
patent: 2007/0034116 (2007-02-01), Mac Donald
patent: 2007/0075291 (2007-04-01), Paik et al.
patent: 2007/0084134 (2007-04-01), Wang et al.
patent: 2007/0092423 (2007-04-01), Hyeon et al.
patent: 2007/0179203 (2007-08-01), Chane-Ching
patent: 2007/0208123 (2007-09-01), Kambe et al.
patent: 2007/0285973 (2007-12-01), Murooka
patent: 2007/0293589 (2007-12-01), Kerns
patent: 2008/0105980 (2008-05-01), Kim
patent: 2008/0113589 (2008-05-01), Feeney et al.
patent: 2008/0188032 (2008-08-01), Rantala
patent: 2008/0188079 (2008-08-01), Kato et al.
patent: 2008/0199392 (2008-08-01), Schumacher et al.
patent: 2009/0053976 (2009-02-01), Roy et al.
patent: 2009/0133336 (2009-05-01), Kim et al.
patent: 1 190 006 (2002-03-01), None

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