Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor
Reexamination Certificate
2007-08-14
2007-08-14
Sarkar, Asok K. (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Physical configuration of semiconductor
C257S098000, C257S432000, C257SE21527
Reexamination Certificate
active
11539310
ABSTRACT:
A composite structure is disclosed that includes a support wafer and a layered structure on the support wafer. The layered structure includes at least one layer of a monocrystalline material and at least one layer of a dielectric material. In addition, the layered structure materials and the thickness of each layer are chosen such that the thermal impedance between ambient temperature and 600° K of the composite structure is a value that is no greater than about 1.3 times the thermal impedance of a monocrystalline bulk SiC wafer having the same dimensions as the composite structure. The composite structure provides sufficient heat dissipation properties for manufacturing optical, electronic, or optoelectronic components.
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Boussagol Alice
Faure Bruce
S.O.I.Tec Silicon on Insulator Technologies
Sarkar Asok K.
Winston & Strawn LLP
Yevsikov Victor V.
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