Image analysis – Histogram processing – For setting a threshold
Patent
1992-01-22
1993-09-07
Moore, David K.
Image analysis
Histogram processing
For setting a threshold
358101, 358107, 356376, G06K 900
Patent
active
052436659
ABSTRACT:
A system is disclosed which operates to collect high resolution three-dimensional surface mesh data from mechanical components which are used for component evaluation. The system includes a multidimensionally movable fixture mount for holding the mechanical components. A structured light pattern emitting projector is provided together with an image sensing camera for detecting impingement of the light pattern on the mechanical component and for generating the surface data. A set of software tools analyzes the data to provide numerical or quantitative component analysis and further presents the data in display form to allow intuitive or qualitative analysis for product and process improvement.
REFERENCES:
patent: 3879133 (1975-04-01), Mathieu
patent: 4089608 (1978-05-01), Hoadley
patent: 4525858 (1985-06-01), Cline et al.
patent: 4555798 (1985-11-01), Broadbent et al.
patent: 4650333 (1987-03-01), Crabb et al.
patent: 4652732 (1987-03-01), Nickl
patent: 4757550 (1988-07-01), Uga
patent: 4767212 (1988-08-01), Kitahashi et al.
patent: 4792232 (1988-12-01), Jobe et al.
patent: 4794262 (1988-12-01), Sato et al.
patent: 4817184 (1989-03-01), Thomason et al.
patent: 4893346 (1990-01-01), Bishop
patent: 4953100 (1990-08-01), Yotsuya
patent: 5076697 (1991-12-01), Takagi et al.
Paul, Robot Manipulators: Mathematics, Programming and Control, MIT Press, 1981, pp. 9 and 65.
Press et al., Numerical Recipes in C: The Art of Scientific Computing, Cambridge Press, 1988, pp. 344-352.
Mardia et al., Multivariate Analysis, Academic Press, 1979, pp. 170-175.
One page brochure, Foxboro/Octek Inc. Non Contact Online Measurement, as seen in "Sensors, The Journal of Machine Perception" vol. 4, No. 11, Nov. 1987.
"Fourier Transform Profilometry for the Automatic Measurement of 3-D Object Shapes", M. Takeda et al, Applied Optics, Dec. 15, 1983, vol. 22, No. 24, p. 3977.
"Fourier Transform Method of Fringe Pattern Analysis For Computer Based Topography and Interferometry", M. Takeda et al, Journal of the Optical Society of America, vol. 72, No. 1, Jan. 1982, p. 156.
Christian Donald J.
Downing Elizabeth A.
Fortunel Christian
Lill Melvin H.
Maney George A.
FMC Corporation
Johns Andrew W.
Kamp R. C.
Megley R. B.
Moore David K.
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