Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2011-08-02
2011-08-02
Duda, Kathleen (Department: 1722)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S329000, C430S311000
Reexamination Certificate
active
07989146
ABSTRACT:
A method for producing a patterned material for electronic or photonic circuits, comprising the steps of:p) providing a substrate;q) coating the substrate with a polymer layer;r) coating a thermal resist solution over the polymer layer to form a thermal resist layer, wherein the polymer layer is substantially immiscible in the thermal resist solution;s) exposing predetermined areas of the thermal resist layer, corresponding to a desired image pattern, using infrared light;t) removing portions of the thermal resist layer corresponding to a desired image pattern, using a developer;u) removing the polymer layer where the thermal resist layer has been previously removed and undercutting a portion of the remaining thermal resist layer by an etching process;v) depositing a material using a substantially anisotropic process; and removing the remaining thermal resist layer and any overlying material with a solvent for the polymer or thermal resist layers leaving the material in a desired pattern.
REFERENCES:
patent: 5017459 (1991-05-01), McColgin
patent: 5360698 (1994-11-01), Hanrahan
patent: 6352814 (2002-03-01), McCullough et al.
patent: 6387597 (2002-05-01), Gelbart
patent: 6423456 (2002-07-01), Kitson et al.
patent: 6541181 (2003-04-01), Levanon et al.
patent: 6890447 (2005-05-01), Natsume et al.
patent: 2002/0094484 (2002-07-01), Buchsbaum et al.
patent: 2004/0114652 (2004-06-01), Yoshikawa
patent: 2006/0240232 (2006-10-01), Faris
patent: 2007/0077511 (2007-04-01), Tredwell et al.
patent: 345699 (1998-11-01), None
patent: 97/39894 (1997-10-01), None
Burberry Mitchell S.
Tutt Lee W.
Bush Nelson Adrian
Duda Kathleen
Eastman Kodak Company
Sullivan Caleen O
LandOfFree
Component fabrication using thermal resist materials does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Component fabrication using thermal resist materials, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Component fabrication using thermal resist materials will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2749070