Completion detection as a means for improving alpha soft-error r

Details Completion detection as a means for improving alpha soft-error r Completion detection as a means for improving alpha soft-error r

1996-02-20

1997-11-25

Westin, Edward P.

Electronic digital logic circuitry

Signal sensitivity or transmission integrity

Output switching noise reduction

326 21, 326 93, 326 98, H03K 19096, H03K 1716

Patent

active

056916523

ABSTRACT:
A system and method for improving alpha-particle induced soft error rates in integrated circuits is provided. Logic isolation circuits implemented using a substantially fewer number of pn-junctions are situated at the outputs of fast logic portions containing a substantially greater number of pn-junctions. The present invention reduces the vulnerability of a dynamic logic circuit of incurring alpha soft errors by effectively trading the probability of an isolation circuit composed of only a few pn-junctions incurring alpha-particle strikes with the probability of a fast logic circuit having substantially more pn-junctions incurring alpha-particle strikes. By reducing the number of pn-junctions susceptible to alpha-particle strikes, the present invention significantly lowers the potential alpha-particle induced soft error rate. In one embodiment, isolation circuits used in the present invention are implemented using self-timed logic, to reduce the window in which a circuit is logically vulnerable to alpha strikes, in which a loss of state can occur.

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