Compensation method and apparatus for use with nonideal test acc

Details Compensation method and apparatus for use with nonideal test acc Compensation method and apparatus for use with nonideal test acc

1983-02-10

1984-08-21

Schreyer, Stafford D.

1791753R, H04M 322

Patent

active

044671490

ABSTRACT:
An arrangement to compensate for the leakage and biasing characteristics associated with the semiconductor crosspoints of a concentrator to allow accurate telephone subscriber loop measurements to be made through the concentrator. A compensation current is supplied which varies linearly with the applied test voltage according to a relationship that is determined adaptively just prior to the test so that the effects of device differences and temperature variations are minimized. The approach is extended to nonlinear compensation.

REFERENCES:
patent: 4401861 (1983-08-01), Braun et al.
Numerical Methods for Scientists and Engineers, by R. W. Hamming, copyright 1962, Section 8.3, pp. 94-97.
"Peripheral System Architecture and Circuit Design", The Bell System Technical Journal, vol. 61, No. 4, Apr. 1982, pp. 451-489.

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