Comparison of semiconductor circuitry simulations

Details Comparison of semiconductor circuitry simulations Comparison of semiconductor circuitry simulations

2007-05-15

2007-05-15

Garbowski, Leigh M. (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C703S014000

Reexamination Certificate

active

10937726

ABSTRACT:
Disclosed is a method of simulating semiconductor circuitry in which trace data received from a first simulation of the semiconductor circuitry, is processed and the values of inputs to the semiconductor circuitry read from the trace data are output to a second simulation of semiconductor circuitry. There is also disclosed a method of determining whether first and second simulations of semiconductor circuitry are equivalent in which transitions in the values of registers simulated by the first and second simulations are analysed, and an error is declared if, following a register in either simulation making a transition to a value which is not equivalent to the corresponding register in the other simulation. The value of the register in the same simulation makes a further transition to a non-equivalent value before the value of the register in the other simulation makes a transition to an equivalent value.

REFERENCES:
patent: 6618839 (2003-09-01), Beardslee et al.
patent: 6885983 (2005-04-01), Ho et al.
patent: 2003/0225565 (2003-12-01), Garcia et al.
patent: 2004/0122644 (2004-06-01), Neifert et al.
patent: 2004/0194046 (2004-09-01), Singhal et al.

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