Compact semiconductor structure

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S640000

Reexamination Certificate

active

06864170

ABSTRACT:
A method for reducing capacitative coupling between interconnects on a semiconductor structure includes producing a first insulating layer on a semiconductor substrate and etching trenches in the first insulating layer. Metallic interconnects are formed in the trenches by metallization. The semiconductor structure is polished to remove metal from the first insulating layer, leaving behind metal in the trenches. A portion of the first insulating layer between the first and second metallic interconnects is etched so that the first and second metallic interconnects project above the first insulating layer. A second insulating layer is applied on the substrate such that the metallic interconnects project into the second insulating layer. The second insulating layer has a relative permittivity that is lower than the relative permittivity of the first insulating layer.

REFERENCES:
patent: 5747880 (1998-05-01), Havemann et al.
patent: 5751066 (1998-05-01), Havemann
patent: 5843845 (1998-12-01), Chung
patent: 6066577 (2000-05-01), Cooney, III et al.
patent: 6222269 (2001-04-01), Usami
patent: 6306754 (2001-10-01), Agarwal
patent: 6376911 (2002-04-01), Ryan et al.
patent: 6566241 (2003-05-01), Chun
patent: 43 19070 (1994-01-01), None
patent: 0 687004 (1995-12-01), None
patent: 0 759635 (1997-02-01), None
patent: 0 860880 (1998-08-01), None
patent: 11163523 (1999-06-01), None
patent: 11354638 (1999-12-01), None
patent: 2001 68548 (2001-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Compact semiconductor structure does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Compact semiconductor structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compact semiconductor structure will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3376870

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.