Common built in test (BIT) software architecture

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Reexamination Certificate

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07343520

ABSTRACT:
A method for conducting a built in test on a system having a central processing unit (CPU), connected to one or more storage means, an input/output means and a plurality of assemblies PCI1, PCI2. . . PCIN to be tested. A test initiator, generally a system wide operating system running on a system CPU, starts the test. Each of the assemblies to be tested has an identified and a test requirement, presented in a format common for, and applicable to, a plurality of central processing units and associated assemblies.

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