Combining commands to form a test command

Details Combining commands to form a test command Combining commands to form a test command

2006-01-24

2006-01-24

Beausoliel, Robert (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S035000

Reexamination Certificate

active

06990610

ABSTRACT:
A device testing method and interface includes receiving a first command and a second command, selectively combining at least a portion of the second command with at least a portion of the first command to generate a test command, and transmitting the test command to the device. In one embodiment, combining the first and second commands reduces the number of test cycles required to test the device.

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