Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2007-03-27
2007-03-27
Lam, David (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S201000, C365S225700
Reexamination Certificate
active
11295878
ABSTRACT:
Programming redundant columns for a multi-plane EEPROM includes identifying a defective memory column during a back-end testing operation to provide redundancy information in the form of the original address for the defective column and the address for corresponding fuse links that are programmed to access a redundant column instead of the defective column. From the address for the corresponding fuse links are provided redundant column word-line select (COL RED WL Select) signals to WL input terminals of a Column Redundancy CAM. From the address for the corresponding fuse links are provided column address decoded COL Address Decoded signals to decoded column address input terminals of the Column Redundancy CAM. All of the fuse links are simultaneously programmed.
REFERENCES:
patent: 5602786 (1997-02-01), Pascucci et al.
patent: 5748543 (1998-05-01), Lee et al.
patent: 5841709 (1998-11-01), McClure
patent: 6246617 (2001-06-01), Urakawa
patent: 6462995 (2002-10-01), Urakawa
Atmel Corporation
Lam David
Schneck Thomas
Schneck & Schneck
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