Column repair circuit for integrated circuits

Details Column repair circuit for integrated circuits Column repair circuit for integrated circuits

1994-04-19

1997-11-18

Dinh, Tan

Static information storage and retrieval

Read/write circuit

Bad bit

371 103, G11C 700

Patent

active

056894643

ABSTRACT:
A column repair circuit for a semiconductor memory having an input/output selection circuit for inputting a control signal, selecting a bit line and a bit bar line corresponding to a faulty memory cell and replacing the selected bit line and bit bar line with a spare bit line and a spare bit bar line. The input/output selection circuit includes an input stage for inputting the control signal, a spare bit line and a spare bit bar line, and a plurality of fuses each having one side connected to the input stage and other side connected to a plurality of resistors. The other side of the resistors are connected to ground for outputting the output signals. The input/output selection circuit further has a plurality of n-channel MOSFETs each including a gate connected to each of the other stages of the plurality of fuses via the resistors in a 2 to 1 manner for inputting the output signals. The drains of the MOSFETS are connected to the spare bit line and spare bit bar line and their sources are connected to each of the plurality of data bit lines and the plurality of data bit bar lines for functioning as a switch. Therefore, the present invention can provide the column repair circuit for a semiconductor memory which is capable of increasing its repair yield by adding the input/output selecting circuit enabling input/output selecting.

REFERENCES:
patent: 4606013 (1986-08-01), Yoshimoto
patent: 4791319 (1988-12-01), Tagami et al.
patent: 4829481 (1989-05-01), Johnson et al.
patent: 5134585 (1992-07-01), Murakami et al.
patent: 5146429 (1992-09-01), Kawai et al.

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