Column analog-to-digital converter of a CMOS image sensor...

Coded data generation or conversion – Sample and hold

Reexamination Certificate

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Details

C341S118000, C341S120000, C341S155000

Reexamination Certificate

active

11328591

ABSTRACT:
A column analog-to-digital (ADC) circuit for preventing a sun black effect in a CMOS image sensor (CIS) is provided. The ADC circuit includes: a comparator having a signal voltage input port and a reference voltage input port, comparing a reset voltage output from one of a plurality of CIS pixels with a reference voltage in a reset sampling period, and outputting an overflow sensing signal when the reset voltage is lower than the reference voltage; and a digital converter converting the output of the comparator into digital data, wherein the digital converter comprises a first latch storing the overflow sensing signal and outputting a flag signal indicating an overflow in response to the overflow sensing signal in a signal sampling period, when the overflow sensing signal is output from the comparator in a first portion of the reset sampling period.

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