Color measurement and control of a sheet material

Paper making and fiber liberation – Processes and products – With measuring – inspecting and/or testing

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162DIG11, 8400, 364471, 356405, 356425, 356429, D21F 1100

Patent

active

050825291

ABSTRACT:
The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S=(1-Rst.sup.2)/2 Rst where K is the dye absorption coefficient and S is the dye scattering coefficient.

REFERENCES:
patent: 3936189 (1976-02-01), De Remigis
patent: 3992100 (1976-11-01), Lodzinski et al.
patent: 4019819 (1977-04-01), Lodzinski
patent: 4098641 (1978-04-01), Casey et al.
patent: 4439038 (1984-03-01), Mactagart
Machamer, "Major Break-through in Reliable On-Line Control of Opacity", Paper Trade Journal, Apr. 29, 1974, pp. 20-24.
Quinn, "Automatic Colour Control on the Papermachine", Paper Technology, vol. 9, No. 4, 1968, pp. 317-320.
Christie, "On-Machine Measurement of the Chromatic Aspects of Appearance", TAPPI, vol. 60, No. 2, Feb. 1977, pp. 119-121.

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