Television – Camera – system and detail – Optics
Reexamination Certificate
2007-02-19
2011-11-08
Ometz, David (Department: 2622)
Television
Camera, system and detail
Optics
C348S272000, C348S273000, C359S486010, C257S290000
Reexamination Certificate
active
08054371
ABSTRACT:
An image sensor device includes a semiconductor substrate having a front surface and a back surface, pixels formed on the front surface of the semiconductor substrate, and grid arrays aligned with one of the pixels. One of the grid arrays is configured to allow a wavelength of light to pass through to the corresponding one of the pixels. The grid arrays are disposed overlying the front or back surface of the semiconductor substrate.
REFERENCES:
patent: 5336879 (1994-08-01), Sauer
patent: 5525828 (1996-06-01), Bassous et al.
patent: 5703357 (1997-12-01), Shih et al.
patent: 6107652 (2000-08-01), Scavennec et al.
patent: 6150683 (2000-11-01), Merrill et al.
patent: 6362513 (2002-03-01), Wester
patent: 6628392 (2003-09-01), Kuroda et al.
patent: 6737719 (2004-05-01), Yamamoto
patent: 6765276 (2004-07-01), Fasen et al.
patent: 6815787 (2004-11-01), Yaung et al.
patent: 6870149 (2005-03-01), Berezin
patent: 7248297 (2007-07-01), Catrysse et al.
patent: 7630133 (2009-12-01), Perkins
patent: 2003/0103150 (2003-06-01), Catrysse et al.
patent: 2004/0042083 (2004-03-01), Turner, III
patent: 2004/0080036 (2004-04-01), Chang et al.
patent: 2004/0085796 (2004-05-01), Tatsumi
patent: 2005/0121599 (2005-06-01), Mouli
patent: 2006/0044429 (2006-03-01), Toda et al.
patent: 2006/0097134 (2006-05-01), Rhodes
patent: 2006/0192083 (2006-08-01), Fu et al.
patent: 2007/0034777 (2007-02-01), Tuckerman et al.
patent: 2007/0257283 (2007-11-01), Chyan et al.
patent: 1008870 (2000-06-01), None
patent: 101042169 (1989-02-01), None
patent: I255440 (2006-05-01), None
patent: WO2005092037 (2005-06-01), None
Peter B. Catrysse et al., “Integrated color pixels in 0.18-um complementary metal oxide semiconductor technology”, 2003 Optical Society of America, vol. 20, No. 12/Dec. 2003, pp. 2293-2306.
L. Yang et al, “High Performance of Fe:InP/InGaAs Metal/Semiconductor/Metal Photodetectors Grown by Metalorganic Vapor Phase Epitaxy”, IEEE Photonics Technology, vol. 2, No. 1, Jan. 1990, pp. 56-58.
Taiwanese Patent Office, Office Action issued Sep. 29, 2010, Application No. 095143350, 8 pages.
Schmidt, et al., “Color filtering metallization for optoelectronic 100nm CMOS circuits,” Electron Devices Meeting, 2003 IEDM 2003 Technical Digest, IEEE International, Dec. 8-10, 2003, pp. 16.2.1-16.2.4.
Chen, et al., “Wavelength detector using a pair of metal-semiconductor-metal photodetectors with subwavelength finger spacings,” Electronics Letters, Aug. 1, 1996, vol. 32, No. 16, 2 pages.
Singapore Written Opinion and Search Report issued Jul. 8, 2010 by the Intellectual Property Office of Singapore for Singapore Application No. 200605020 7, 17 pages.
Tseng Chien-Hsien
Wang Ching-Chun
Wuu Shou-Gwo
Yaung Dun-Nian
Haynes and Boone LLP
Le Quang
Ometz David
Taiwan Semiconductor Manufacturing Company , Ltd.
LandOfFree
Color filter for image sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Color filter for image sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Color filter for image sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4310704