Coherent periodically pulsed radiation spectrometer

Details Coherent periodically pulsed radiation spectrometer Coherent periodically pulsed radiation spectrometer

1995-10-19

1998-05-05

Hantis, K.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01J 328

Patent

active

057483094

ABSTRACT:
A spectroscopy method is defined in which a first source of radiation (51) emits a periodically pulsed beam (A) having a repetition frequency .omega. and in that a second source of radiation (52) emits a periodically pulsed beam (B) having a repetition frequency .omega.+.DELTA., the beams are united with each other and directed at a material specimen (6) to be analyzed and a detector means determines the amplitudes of the frequency components n.DELTA. of the beam emanating from the material specimen.

REFERENCES:
patent: 5293213 (1994-03-01), Klein et al.
Bostak et al, All-Electronic Generation of Sub-Picosecond Shock Waves and Their Application to a Terahertz Spectroscopy System; OSA Topical Meeting on Ultra Fast Electronics and Optoelectronics, San Francisco Jan. 23-25, 1993 pp. 1-4.
Grischkowsky et al, "Far Infrared . . . Semiconductors," J. Opt. Soc. Am. B/vol. 7, No. 10 Oct. 1990 pp. 2006-2015.

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