Codeposition of hafnium-germanium oxides on substrates used...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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C438S685000, C438S761000, C438S778000, C438S780000, C438S783000, C438S790000, C257SE21274

Reexamination Certificate

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11124451

ABSTRACT:
Methods of film deposition using metals and metal oxides. A thin film of germanium oxide and an oxide of a non-germanium metal is deposited by ALD by alternating deposition of first and second precursor compounds, wherein the first precursor compound includes a metal other than germanium, and the second precursor compound includes germanium.

REFERENCES:
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patent: 2003/0168001 (2003-09-01), Sneh
patent: 2004/0023461 (2004-02-01), Ahn et al.
patent: 2004/0157354 (2004-08-01), Kuriyama et al.
patent: 2004/0175882 (2004-09-01), Ahn et al.
“Ultralow Loss High Delta Silica Germania Planar Waveguides”, R. A. Bellman, G. Bourdon, G. Alibert, A. Beguin, E. Guiot, L. B. Simpson, P. Lehuede, L. Guiziou, E. LeGuen J. Electrochem. Soc., vol. 151, Issue 8, pp. G541-G547 (2004).
“Microwave Discharge Deposition of Oxide Films at Low Temperatures”, D.R. Secrist and J.D. Mackenzie, 1966, American Ceramic Society, pp. 784-788.

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