Optics: measuring and testing – By dispersed light spectroscopy – With aperture mask
Patent
1995-06-06
1997-05-06
Hantis, K.
Optics: measuring and testing
By dispersed light spectroscopy
With aperture mask
G01J 304
Patent
active
056276397
ABSTRACT:
An imaging spectrometer that includes a mask (214) that has an array of n rows (302) and n columns (304) of transmissive elements (306) for transmitting the light from a plurality of locations of an image and of opaque elements (308) for blocking light from a plurality of locations of the image. The transmissive and opaque elements are arranged in a Hadamard pattern having rows (and columns) that are different cyclic iterations of an m-sequence. A grating (110) disperses the transmitted light from the transmissive elements (306) in a linear spatial relationship in a predetermined relationship to the wavelength of the transmitted light. A detector array (406) has a plurality of detector elements (408) arranged in a row to receive the dispersed transmitted light from the grating (110). Each detector element (408) provides an intensity signal indicative of the intensity of the light impinging thereon. A computer (410) generates a spectrum matrix having elements indicative of the frequency spectrum of the plurality of locations of the image. The spectrum matrix is produced by matrix multiplication of an inverse mask pattern matrix and a data matrix. Each element of the mask pattern matrix is either a 0 for opaque elements (308) or a 1 for transmissive elements (306). The inverse mask pattern matrix is generated by replacing each 0 of the pattern by -1, taking the transpose, and multiplying by 2/(n+1). Each row of the data matrix represents data taken from the same location of the image and through a corresponding row of the mask (214).
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Claflin Edward S.
Mende Stephen B.
Hantis K.
Lockheed Missiles & Space Company Inc.
Radlo Edward J.
Weller Edward B.
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