Coating quality measuring device

Details Coating quality measuring device Coating quality measuring device

1985-09-19

1987-01-13

Wan, Gene

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250566, G01V 904

Patent

active

046366482

ABSTRACT:
A coating quality measuring device has a pattern plate including one reference pattern portion having a larger pattern width and a plurality of strip pattern portions having different pattern widths which are smaller than that of the reference pattern portion and are decreased in order. The pattern plate is disposed opposite the coated surface. The pattern plate is reflected on the coated surface and a reflected image is formed on an image sensor. The image sensor successively outputs signals each corresponding to the lightness of each pattern portion on a line extending in a width direction of each pattern portion of the reflected image. A computing device calculates a difference between the peak value of the signal level of the output signal corresponding to each strip pattern portion in the reflected image and the signal level of the output signal corresponding to the ground portion, divides the calculated difference by the signal level of the output signal corresponding to the reference pattern portion and detects the pattern width of the strip pattern portion wherein the division value becomes not larger than a predetermined value, thereby to obtain the coating quality of the coated surface.

REFERENCES:
patent: 4522497 (1985-06-01), Ikin

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