Compositions – Etching or brightening compositions
Reexamination Certificate
2007-04-03
2007-04-03
Norton, Nadine G. (Department: 1765)
Compositions
Etching or brightening compositions
C252S079200, C252S079400, C438S692000
Reexamination Certificate
active
10902940
ABSTRACT:
CMP slurry contains a polishing component to polish a region to be polished, which includes at least one of a sub-region made of insulative material and a sub-region made of conductive material, and a restoring component to restore a scratch caused on the region to be polished. The scratch can be thus reduced during the polishing.
REFERENCES:
patent: 6062952 (2000-05-01), Robinson et al.
patent: 6136711 (2000-10-01), Grumbine et al.
patent: 6352595 (2002-03-01), Svirchevski et al.
patent: 2001/0049912 (2001-12-01), Motonari et al.
patent: 8-321479 (1996-12-01), None
patent: 2000104047 (2000-04-01), None
patent: 2001-57367 (2001-02-01), None
patent: 2002-511650 (2002-04-01), None
Tsutsumi et al., Polsihing Water-Repellent Compostion for Automobile, Apr. 11, 2000, ComputerGenerated English Translation of JP 2000104047 A, 10 pages.
Notification of Reasons for Rejection issued by Japanese Patent Office on Oct. 5, 2004 in Japanese application No. 2001-362923, and English translation of Notification.
Kurashima Nobuyuki
Minamihaba Gaku
Yano Hiroyuki
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Norton Nadine G.
Umez-Eronini Lynette T.
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